Research on measuring method of key parameters of multi-pixel photon counter
Multi-pixel photon counters (MPPCs) have attracted much attention in low-light detection, andhave been widely used in lidar, high-energy particle physics, nuclear physics, astrophysics, nuclear medicine imaging and spectroscopy. Accurate measuring of MPPC key parameters is the prerequisite for judging its performance level. In this paper, the measuring methods of key parameters of MPPCare studied comprehensively, and relatively simple measuring methods are proposed, mainly including the measuring methods of pulse waveform characteristics, Dark Counting Rate (DCR), Photon DetectionEfficiency (PDE), photon number-resolved spectrum, optical crosstalk probability, gain and reverse volt-ampere characteristics of MPPC. A test measuring system is built. The parameters of typical MPPC devices are measured experimentally. The test results are reasonable, and the measured values of various parameters are basically consistent with the nominal values in the MPPCdevice specification.
Authors
- Guoqing Zhang (ORCID: https://orcid.org/0000-0003-0110-8614)
- Lianbi Li (ORCID: https://orcid.org/0000-0003-1447-1834)
- Zebin Li (ORCID: https://orcid.org/0000-0003-3285-1857)
- Lina Liu (ORCID: https://orcid.org/0000-0002-1298-6941)
- Yue Wang (ORCID: https://orcid.org/0000-0002-4639-3714)
- Yanfei Yang (ORCID: https://orcid.org/0009-0009-6062-3537)
- Lei Wang (ORCID: https://orcid.org/0000-0002-7700-4531)
- Lu Liu (ORCID: https://orcid.org/0000-0001-8137-671X)
- Yun Wu
- Xiaoxiang Han (ORCID: https://orcid.org/0000-0002-1946-2067)
Institutions
- Xi'an Polytechnic University (CN)
- Xi'an University of Technology (CN)
Publication Details
- Published
- 2024-12-04
- DOI
- https://doi.org/10.1117/12.3038115
- Primary Topic
- Advanced Optical Sensing Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00