Comparison of 632nm laser dazzling effect on CCD and CMOS image sensors

In order to compare the laser dazzling effects of CCD and CMOS image sensors, dazzling experiments with the wavelength of 632nm laser are conducted, including direct laser irradiation on CCD and CMOS image sensors, laser irradiation on CCD and CMOS image sensors via an imaging lens, and laser irradiation on different models of CCD and CMOS image sensors via an imaging lens. The pixel-level saturation thresholds and full-screen saturation thresholds of CCD and CMOS image sensors at different conditions are summarized. The experimental results show that CMOS image sensor is more difficult to be dazzled than CCD image sensor at the same experimental condition, and the saturation threshold of the former is one order of magnitude higher than that of the latter. Image sensors equipped with imaging lens are more difficult to be dazzled than image sensors without imaging lens, and the saturation threshold of the former is 3~4 orders of magnitude higher than that of the latter. The exposure modes of image sensors have certain impact on the dazzling effect, and the automatic exposure mode can weaken the laser dazzling effect to a certain extent. Finally, the mechanism of the special dazzling phenomena such as saturation crosstalk and pixel upset is explained.

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Publication Details

Published
2024-12-04
DOI
https://doi.org/10.1117/12.3037275
Primary Topic
Ocular and Laser Science Research
Type
article
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Comparison of 632nm laser dazzling effect on CCD and CMOS image sensors

Hengyan Zhou, Hang Zhao, Zengguang Qin, Tiancheng Yu et al.
Ocular and Laser Science Research
article

Comparison of 632nm laser dazzling effect on CCD and CMOS image sensors

Hengyan Zhou, Hang Zhao, Zengguang Qin, Tiancheng Yu, C. Li
article en

Abstract

In order to compare the laser dazzling effects of CCD and CMOS image sensors, dazzling experiments with the wavelength of 632nm laser are conducted, including direct laser irradiation on CCD and CMOS image sensors, laser irradiation on CCD and CMOS image sensors via an imaging lens, and laser irradiation on different models of CCD and CMOS image sensors via an imaging lens. The pixel-level saturation thresholds and full-screen saturation thresholds of CCD and CMOS image sensors at different conditions are summarized. The experimental results show that CMOS image sensor is more difficult to be dazzled than CCD image sensor at the same experimental condition, and the saturation threshold of the former is one order of magnitude higher than that of the latter. Image sensors equipped with imaging lens are more difficult to be dazzled than image sensors without imaging lens, and the saturation threshold of the former is 3~4 orders of magnitude higher than that of the latter. The exposure modes of image sensors have certain impact on the dazzling effect, and the automatic exposure mode can weaken the laser dazzling effect to a certain extent. Finally, the mechanism of the special dazzling phenomena such as saturation crosstalk and pixel upset is explained.

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Comparison of 632nm laser dazzling effect on CCD and CMOS image sensors — Hengyan Zhou, Hang Zhao, et al. · (2024) | TGRS Research Map | TGRS