Alignment requirement of retro-reflective target in self-mixing interferometry

It is generally assumed that using a retro-reflective surface as the target of an interferometric measurement, an accurate alignment to the illumination beam is not really necessary. On the contrary, we show that even a few degrees of angular misalignment can corrupt the interferometric signal with the onset of a large artifact, which is also misleading because it is similar to the waveform of the high-level feedback regime. We first provide the experimental evidence of the artifact in a self-mixing interferometer, showing that the artifact is canceled after an alignment to <0.2 deg error, and then provide a theoretical evaluation, in good agreement with the observations.

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Publication Details

Journal
Optical Engineering
Published
2024-12-04
DOI
https://doi.org/10.1117/1.oe.63.12.124102
Primary Topic
Semiconductor Lasers and Optical Devices
Type
article
Field-Weighted Citation Impact
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article

Alignment requirement of retro-reflective target in self-mixing interferometry

Adrien Albert, Silvano Donati, San‐Liang Lee
Optical Engineering
Semiconductor Lasers and Optical Devices
article

Alignment requirement of retro-reflective target in self-mixing interferometry

Adrien Albert, Silvano Donati, San‐Liang Lee
article en

Abstract

It is generally assumed that using a retro-reflective surface as the target of an interferometric measurement, an accurate alignment to the illumination beam is not really necessary. On the contrary, we show that even a few degrees of angular misalignment can corrupt the interferometric signal with the onset of a large artifact, which is also misleading because it is similar to the waveform of the high-level feedback regime. We first provide the experimental evidence of the artifact in a self-mixing interferometer, showing that the artifact is canceled after an alignment to <0.2 deg error, and then provide a theoretical evaluation, in good agreement with the observations.

Optical EngineeringVol. 63(12)
National Taiwan University of Science and Technology (TW), University of Pavia (IT)
Openalex Percentile: Top 80%
Semiconductor Lasers and Optical Devices
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