Adaptive Single-Event Latch-up Protector for Space Applications
This paper proposes an innovative device-level solution for Single-Event Latch-up (SEL) protection. It introduces a programmable, adaptive, and integrated protection mechanism that offers more targeted and higher protection compared to system-level solutions. The proposed monolithic mixed-signal integrated circuit continuously monitors the current demanded by the Device Under Protection (DUP). If the current exceeds a specific threshold, the circuit disconnects the DUP from the power supply. The circuit’s dynamic threshold determination adapts to variations caused by radiation and aging, ensuring the threshold is high enough to prevent unnecessary shutdowns and low enough to protect the DUP’s integrity. This approach allows the use of Commercial Off-The-Shelf (COTS) components in space electronics, reducing costs while providing protection against critical SEL effects without special radiation hardening techniques.
Authors
- C. Luján‐Martínez (ORCID: https://orcid.org/0000-0003-4389-7375)
- R.G. Carvajal (ORCID: https://orcid.org/0000-0003-3891-8987)
- José María Hinojo (ORCID: https://orcid.org/0000-0002-3071-9900)
- P. González-Bautista
- M. Palmero-Delgado
- F. Muñnoz-Chavero
Institutions
- Universidad de Sevilla (ES)
Publication Details
- Published
- 2024-11-13
- DOI
- https://doi.org/10.1109/dcis62603.2024.10769042
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00