Cambricon-LLM: A Chiplet-Based Hybrid Architecture for On-Device Inference of 70B LLM
Deploying advanced large language models on edge devices, such as smartphones and robotics, is a growing trend that enhances user data privacy and network connectivity resilience while preserving intelligent capabilities. However, such a task exhibits single-batch computing with incredibly low arithmetic intensity, which poses the significant challenges of huge memory footprint and bandwidth demands on limited edge resources. To address these issues, we introduce Cambricon-LLM, a chiplet-based hybrid architecture with NPU and a dedicated NAND flash chip to enable efficient on-device inference of 70B LLMs. Such a hybrid architecture utilizes both the high computing capability of NPU and the data capacity of the NAND flash chip, with the proposed hardware-tiling strategy that minimizes the data movement overhead between NPU and NAND flash chip. Specifically, the NAND flash chip, enhanced by our innovative in-flash computing and on-die ECC techniques, excels at performing precise lightweight on-die processing. Simultaneously, the NPU collaborates with the flash chip for matrix operations and handles special function computations beyond the flash's on-die processing capabilities. Overall, Cambricon-LLM enables the on-device inference of 70B LLMs at a speed of 3.44 token/s, and 7B LLMs at a speed of 36.34 token/s, which is over 22× to 45× faster than existing flash-offloading technologies, showing the potentiality of deploying powerful LLMs in edge devices.
Authors
- Yifan Hao (ORCID: https://orcid.org/0009-0005-2013-5118)
- Shengwen Liang (ORCID: https://orcid.org/0000-0001-8407-2594)
- Ziyuan Nan
- Zhongkai Yu (ORCID: https://orcid.org/0000-0001-9893-3498)
- Zidong Du (ORCID: https://orcid.org/0000-0002-7603-4210)
- Tianyun Ma (ORCID: https://orcid.org/0009-0006-4204-0686)
- Xinkai Song (ORCID: https://orcid.org/0000-0003-3458-1555)
- Di Huang (ORCID: https://orcid.org/0009-0009-8712-8747)
- Yihao Cai (ORCID: https://orcid.org/0009-0005-9438-8716)
- Jie Zhang (ORCID: https://orcid.org/0000-0001-9803-7140)
- Qi Guo (ORCID: https://orcid.org/0000-0002-8329-7668)
- Xing Hu (ORCID: https://orcid.org/0000-0002-9979-0561)
- Tian Zhi
- Tianshi Chen
- Yongwei Zhao (ORCID: https://orcid.org/0000-0002-5503-4457)
Institutions
- University of Science and Technology of China (CN)
- Peking University (CN)
- Institute of Computing Technology (CN)
- Cambricon (China)
- University of Science and Technology Beijing (CN)
Publication Details
- Published
- 2024-11-02
- DOI
- https://doi.org/10.1109/micro61859.2024.00108
- Citations
- 16
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 7.82