Electrochemical Models for Connector Degradation

Extensive test data and theories exist regarding terminal connector degradation. Nevertheless, a mathematical model correlated to real world testing and materials offers a significant enhancement to the understanding and prediction of real-world connector system reliability. After a review of historical degradation physics, mathematical models, an applicable model is developed which takes key degradation inputs into account for a dynamically adjustable prediction. Additionally, future work including time variable inputs discussed for more accurate, real world, prediction of connector reliability.