Non-Destructive Testing of Resistive Components Using Low-Frequency Noise Measurement

In this paper, we analyze the drift of low-frequency noise power for carbon-based resistive components after electric pulse action. The processing was carried out with single and serial pulses. A low-noise cascade amplifier and an oscilloscope were used to study the low-frequency noise. The level of low-frequency noise was compared with the resistance of the resistive component. The greatest drift of low-frequency noise was recorded when exposed to a pulse sequence. A correlation was established between the change in the low-frequency noise power and the drift of the dissipated power of the resistive component after exposure to an electric pulse. In this case, the low-frequency noise power changed faster than the dissipated power of the resistor. Based on the drift of the studied parameters, a preliminary empirical expression was obtained for predicting the electrophysical parameters of the resistive components. From a scientific and practical point of view, an important result was obtained, which in the future can be used as a non-destructive method for testing the parameters of resistive components.

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Publication Details

Published
2024-11-13
DOI
https://doi.org/10.1109/tirved63561.2024.10769821
Primary Topic
Non-Destructive Testing Techniques
Type
article
Field-Weighted Citation Impact
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article

Non-Destructive Testing of Resistive Components Using Low-Frequency Noise Measurement

Yu. V. Sakharov, Vyacheslav A. Sokurenko
Non-Destructive Testing Techniques
article

Non-Destructive Testing of Resistive Components Using Low-Frequency Noise Measurement

Yu. V. Sakharov, Vyacheslav A. Sokurenko
article en

Abstract

In this paper, we analyze the drift of low-frequency noise power for carbon-based resistive components after electric pulse action. The processing was carried out with single and serial pulses. A low-noise cascade amplifier and an oscilloscope were used to study the low-frequency noise. The level of low-frequency noise was compared with the resistance of the resistive component. The greatest drift of low-frequency noise was recorded when exposed to a pulse sequence. A correlation was established between the change in the low-frequency noise power and the drift of the dissipated power of the resistive component after exposure to an electric pulse. In this case, the low-frequency noise power changed faster than the dissipated power of the resistor. Based on the drift of the studied parameters, a preliminary empirical expression was obtained for predicting the electrophysical parameters of the resistive components. From a scientific and practical point of view, an important result was obtained, which in the future can be used as a non-destructive method for testing the parameters of resistive components.

Ministry of Science and Higher Education of the Russian Federation
Openalex Percentile: Top 78%
Non-Destructive Testing Techniques
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