Computer Vision Technology for Short Fiber Segmentation and Measurement in Scanning Electron Microscopy Images

Computer vision technology for the automatic recognition and geometric characterization of carbon and glass fibers in scanning electron microscopy images is proposed. The proposed pipeline, combining the SAM model and DeepLabV3+, provides the generalizability and accuracy of the foundational SAM model and the ability to quickly train on a small amount of data via the DeepLabV3+ model. The pipeline was trained several times more rapidly with lower requirements for computing resources than fine-tuning the SAM model, with comparable inference time. On the basis of the pipeline, an end-to-end technology for processing images of electron microscopic fibers was developed, the input of which is images with metadata and the output of which is statistics on the distribution of the geometric characteristics of the fibers. This innovation is of great practical importance for modeling the physical characteristics of materials. This paper proposes a few-shot training procedure for the DeepLabV3+/SAM pipeline, combining the training of the DeepLabV3+ model weights and the SAM model parameters. It allows effective training of the pipeline using only 37 real labeled images. The pipeline was then adapted to a new type of fiber and background using 15 additional real labeled images. This article also proposes a method for generating synthetic data for training neural network models, which improves the quality of segmentation by the IoU and PixAcc metrics from 0.943 and 0.949 to 0.953 and 0.959, i.e., by 1% on average. The developed pipeline significantly reduces the time required to evaluate fiber length in scanning electron microscope images.