Predictive Testing for Aging in SRAMs and Mitigation

We develop a method to estimate lifetime performance, yield, and power for Static Random-Access Memories (SRAMs) that captures the combination of process variations and aging. Using this method, we design and validate predictive tests to detect future aging failures. We use the results of predictive tests to reconfigure dynamic voltage and frequency scaling (DVFS) to reduce aging failures at minimal energy and latency overheads.