Practical Nuances of Laser Diode Characterization: A Methods Article [Instrumentation and Measurement Systems]

Laser diode characteristics are described in several hand-books on semiconductor lasers; however, despite this abundance, to our best knowledge no handbook discusses the practical issues that may be encountered by an engineer who tries to determine the performance of a laser diode. This is why in this column we outline and discuss several physical effects that might be difficult to interpret by an inexperienced researcher or even appear un-physical. While our considerations are based mainly on 1300 nm and 1550 nm laser diodes, some of the practical insights may be useful in other spectral ranges.

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Publication Details

Journal
IEEE Instrumentation & Measurement Magazine
Published
2024-11-29
DOI
https://doi.org/10.1109/mim.2024.10772018
Primary Topic
Advanced Measurement and Metrology Techniques
Type
article
Field-Weighted Citation Impact
0.00

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article

Practical Nuances of Laser Diode Characterization: A Methods Article [Instrumentation and Measurement Systems]

Steven Kleijn, Martino Bernard, Marcin Zyskowski, Francisco Javier Díaz Otero
IEEE Instrumentation & Measurement Magazine
Advanced Measurement and Metrology Techniques
article

Practical Nuances of Laser Diode Characterization: A Methods Article [Instrumentation and Measurement Systems]

Steven Kleijn, Martino Bernard, Marcin Zyskowski, Francisco Javier Díaz Otero
article en

Abstract

Laser diode characteristics are described in several hand-books on semiconductor lasers; however, despite this abundance, to our best knowledge no handbook discusses the practical issues that may be encountered by an engineer who tries to determine the performance of a laser diode. This is why in this column we outline and discuss several physical effects that might be difficult to interpret by an inexperienced researcher or even appear un-physical. While our considerations are based mainly on 1300 nm and 1550 nm laser diodes, some of the practical insights may be useful in other spectral ranges.

IEEE Instrumentation & Measurement MagazineVol. 27(9)
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Openalex Percentile: Top 78%
Advanced Measurement and Metrology Techniques
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