A Robust DT ∆Σ Modulator for High-Resolution Sensor Against Temperature Variations
This paper presents a 1-bit third-order delta-sigma modulator for high-resolution sensors. By sharing digital-to-analog converter (DAC) and sampling capacitors, we mitigate the influence of KT/C noise, while enhancing resolution through a chopping technique and internal feedback loop. The prototype chip is fabricated in a 28-nm CMOS process with an area of 0.122 mm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>. It achieves a peak signal-to-noise ratio (SNR) of 83.6 dB and a peak signal-to-noise and distortion ratio (SNDR) of 81.6 dB in a 20 kHz signal bandwidth while consuming 13.3 mW from a 1.8 V power supply.
Authors
- Jeongjin Roh (ORCID: https://orcid.org/0000-0001-6930-8183)
- Sangwook Na (ORCID: https://orcid.org/0009-0000-8743-0000)
- Jihun Choi (ORCID: https://orcid.org/0009-0000-4562-1335)
- Tae Hun Kim (ORCID: https://orcid.org/0000-0001-6292-9956)
Institutions
- Hanyang University (KR)
Publication Details
- Published
- 2024-08-19
- DOI
- https://doi.org/10.1109/isocc62682.2024.10762184
- Primary Topic
- Sensor Technology and Measurement Systems
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Korea Institute for Advancement of Technology
- IC Design Education Center
- Korea Evaluation Institute of Industrial Technology