SEC-CiM: Selective Error Compensation for ReRAM-based Compute-in-Memory^*

ReRAM-based Compute-in-Memory (CiM) architectures offer an attractive design choice for accelerating Convolutional Neural Network (CNN) inferencing in edge computing environments. However, these architectures are susceptible to stuck-at-faults (SAFs) in ReRAM cells stemming from manufacturing defects and cell wearout over time, significantly degrading CNN inferencing accuracy. To address this challenge, we propose a technique called Selective Error Compensation for CiM (SEC-CiM). This technique strategically mitigates errors by leveraging the insight that compensating for errors in a limited number of selected columns in a crossbar is sufficient to maintain CNN inferencing accuracy. With this strategy, SEC-CiM achieves significantly lower overhead compared to previous work. Notably, it effectively addresses errors resulting from stuck-at intermediate levels, a critical aspect that was previously overlooked. We develop a theoretical framework to determine the minimum number of columns requiring error compensation. Simulation results demonstrate that SEC-CiM limits the drop in inferencing accuracy to 2% for the ResNet18 and VGG16 models, even when up to 30% of the ReRAM cells in the crossbar are faulty. Similarly, for the Densenet121 CNN, comparable accuracy results are obtained when up to 15% of the ReRAM cells are faulty. We achieve this high level of fault tolerance with moderate area and power consumption overhead of 12.2% and 10.2%, respectively.