Calibrating the Dark Count Rate of Single Photon Avalanche Diodes Using Linear Regression

The Dark Count Rate (DCR) is an inherent characteristic of Single Photon Avalanche Diodes (SPADs). Despite the use of an Active Quenching Active Reset (AQAR) scheme to reduce DCR at the circuit level, the counter connected to the quenching circuit often registers an increase, even in the absence of intended light input. Consequently, an external method is required for accurate calibration of the DCR. This paper proposes the use of linear regression, implemented in a Python program, as a method for such calibration.

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Published
2024-08-19
DOI
https://doi.org/10.1109/isocc62682.2024.10762487
Primary Topic
Advanced Optical Sensing Technologies
Type
article
Field-Weighted Citation Impact
0.00

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article

Calibrating the Dark Count Rate of Single Photon Avalanche Diodes Using Linear Regression

Jinwook Burm, Youngmin Cho
Advanced Optical Sensing Technologies
article

Calibrating the Dark Count Rate of Single Photon Avalanche Diodes Using Linear Regression

Jinwook Burm, Youngmin Cho
article en

Abstract

The Dark Count Rate (DCR) is an inherent characteristic of Single Photon Avalanche Diodes (SPADs). Despite the use of an Active Quenching Active Reset (AQAR) scheme to reduce DCR at the circuit level, the counter connected to the quenching circuit often registers an increase, even in the absence of intended light input. Consequently, an external method is required for accurate calibration of the DCR. This paper proposes the use of linear regression, implemented in a Python program, as a method for such calibration.

Sogang University (KR)
National Research Foundation, Korea Institute for Advancement of Technology, Samsung, Technology Development
Affordable and clean energy
Openalex Percentile: Top 83%
Advanced Optical Sensing Technologies
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