Laser-scanning optical-frequency-comb microscopy for multimodal imaging

Abstract We introduce laser-scanning optical-frequency-comb microscopy, a technique that enables comprehensive multimodal spectroscopic imaging by analyzing interferograms via a dual-comb spectroscopic approach. This method captures diverse optical information, including amplitude, phase, polarization, frequency, and time of flight, from a single measurement. We demonstrate the versatility and efficiency of this technique through applications in surface profilometry, time-of-flight measurements, and polarization analysis. This approach enhances optical microscopy capabilities, offering a powerful tool for detailed material characterization in both science fields and industrial applications.

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Publication Details

Journal
Japanese Journal of Applied Physics
Published
2024-11-29
DOI
https://doi.org/10.35848/1347-4065/ad98d2
Citations
2
Primary Topic
Advanced Fiber Laser Technologies
Type
article
Field-Weighted Citation Impact
0.68

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article

Laser-scanning optical-frequency-comb microscopy for multimodal imaging

Tomoya Okabe, Eiji Hase, Kaoru Minoshima, Shota Nakano et al.
2 citations
Japanese Journal of Applied Physics
Advanced Fiber Laser Technologies
0.68
article

Laser-scanning optical-frequency-comb microscopy for multimodal imaging

Tomoya Okabe, Eiji Hase, Kaoru Minoshima, Shota Nakano, Hirotsugu Yamamoto, Takeshi Yasui, Kazumichi Yoshii, Hidenori Koresawa, Takeo Minamikawa, Akifumi Asahara, Keishiro Ootani, Shimpei Kajiwara
article en
2 citations

Abstract

Abstract We introduce laser-scanning optical-frequency-comb microscopy, a technique that enables comprehensive multimodal spectroscopic imaging by analyzing interferograms via a dual-comb spectroscopic approach. This method captures diverse optical information, including amplitude, phase, polarization, frequency, and time of flight, from a single measurement. We demonstrate the versatility and efficiency of this technique through applications in surface profilometry, time-of-flight measurements, and polarization analysis. This approach enhances optical microscopy capabilities, offering a powerful tool for detailed material characterization in both science fields and industrial applications.

Japanese Journal of Applied PhysicsVol. 63(12)
Ryukoku University (JP), Otsuka (Japan) (JP), University of Electro-Communications (JP), Utsunomiya University (JP), Tokushima University (JP), The University of Osaka (JP)
Japan Society for the Promotion of Science, Precursory Research for Embryonic Science and Technology, Exploratory Research for Advanced Technology
Openalex Percentile: Top 29%
Advanced Fiber Laser Technologies
0.68
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