Quantitative elemental sensitive imaging based on K-edge subtraction tomography
The method described in this paper is expected to expand the scope of applications for K-edge subtraction tomography and provide a novel approach to achieve more precise and convenient quantitative elemental analysis.
Authors
- Ruoyang Gao (ORCID: https://orcid.org/0000-0002-1063-757X)
- Yichi Zhang (ORCID: https://orcid.org/0000-0002-3841-4837)
- Tiqiao Xiao (ORCID: https://orcid.org/0000-0003-4923-3641)
- Cheng Wang (ORCID: https://orcid.org/0000-0002-1834-2119)
- Fen Tao
- Guohao Du (ORCID: https://orcid.org/0000-0003-0030-8817)
- Biao Deng
- Ling Zhang (ORCID: https://orcid.org/0000-0002-4991-1134)
Institutions
- Chinese Academy of Sciences (CN)
- Shanghai Advanced Research Institute (CN)
- Shanghai Institute of Applied Physics (CN)
- University of Chinese Academy of Sciences (CN)
Publication Details
- Journal
- Journal of X-Ray Science and Technology
- Published
- 2024-11-27
- DOI
- https://doi.org/10.1177/08953996241290323
- Citations
- 2
- Primary Topic
- Advanced X-ray and CT Imaging
- Type
- article
- Field-Weighted Citation Impact
- 0.37
Funders
- National Natural Science Foundation of China