Deep Reinforcement Learning-Based Automatic Test Case Generation for Hardware Verification

This paper presents a novel deep reinforcement learning-based framework for automatic test case generation in hardware verification. The proposed approach combines traditional verification methods with advanced deep learning techniques to enhance test coverage and security vulnerability detection. The framework incorporates a modified Deep Q-Network architecture with prioritized experience replay, integrated with static analysis and dynamic mutation strategies. The system utilizes a comprehensive reward mechanism that considers multiple coverage metrics, including line coverage, toggle coverage, FSM coverage, and security asset coverage. Experimental evaluation of diverse benchmark designs, including AES cores, RISC-V processors, and network controllers, demonstrates significant improvements over conventional methods. The results show an average coverage improvement of 17.2% and a 65% reduction in verification time compared to traditional approaches. The framework achieves 95.4% average coverage across benchmark designs and a 94.8% detection rate for security vulnerabilities. Additionally, the system demonstrates good scalability characteristics, maintaining performance efficiency across varying design complexities. The experimental results validate the effectiveness of the proposed approach in automating hardware verification processes while improving test coverage and security vulnerability detection capabilities.

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Publication Details

Journal
Journal of Artificial Intelligence General science (JAIGS) ISSN 3006-4023
Published
2024-11-28
DOI
https://doi.org/10.60087/jaigs.v6i1.267
Citations
3
Primary Topic
Software Testing and Debugging Techniques
Type
article
Field-Weighted Citation Impact
1.46
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article

Deep Reinforcement Learning-Based Automatic Test Case Generation for Hardware Verification

Wenxuan Zheng, Lei Yan, Shikai Wang, Jingyi Chen
3 citations
Journal of Artificial Intelligence General science (JAIGS) ISSN 3006-4023
Software Testing and Debugging Techniques
1.46
article

Deep Reinforcement Learning-Based Automatic Test Case Generation for Hardware Verification

Wenxuan Zheng, Lei Yan, Shikai Wang, Jingyi Chen
article en
3 citations

Abstract

This paper presents a novel deep reinforcement learning-based framework for automatic test case generation in hardware verification. The proposed approach combines traditional verification methods with advanced deep learning techniques to enhance test coverage and security vulnerability detection. The framework incorporates a modified Deep Q-Network architecture with prioritized experience replay, integrated with static analysis and dynamic mutation strategies. The system utilizes a comprehensive reward mechanism that considers multiple coverage metrics, including line coverage, toggle coverage, FSM coverage, and security asset coverage. Experimental evaluation of diverse benchmark designs, including AES cores, RISC-V processors, and network controllers, demonstrates significant improvements over conventional methods. The results show an average coverage improvement of 17.2% and a 65% reduction in verification time compared to traditional approaches. The framework achieves 95.4% average coverage across benchmark designs and a 94.8% detection rate for security vulnerabilities. Additionally, the system demonstrates good scalability characteristics, maintaining performance efficiency across varying design complexities. The experimental results validate the effectiveness of the proposed approach in automating hardware verification processes while improving test coverage and security vulnerability detection capabilities.

Journal of Artificial Intelligence General science (JAIGS) ISSN 3006-4023Vol. 6(1)
University of California, Los Angeles (US), New York University (US), Carnegie Mellon University (US), Nanjing University of Aeronautics and Astronautics (CN)
Openalex Percentile: Top 14%
Software Testing and Debugging Techniques
1.46
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Deep Reinforcement Learning-Based Automatic Test Case Generation for Hardware Verification — Wenxuan Zheng, Lei Yan, et al. · Journal of Artificial Intelligence General science (JAIGS) ISSN 3006-4023 (2024) | TGRS Research Map | TGRS