FEM modeling of magnetoelectric composites using line elements for thin film structure
This study conducts a comprehensive computational analysis of thin film deposited magnetoelectric (ME) composites, focusing on two distinct configurations: the self-biased Ni/(YXl)163° LiNbO 3 /Ni and the non-self-biased Ni/PZT-5H/Ni. This involves employing a multiphysics simulation tool based on the Finite Element Method (FEM). Our FEM modeling utilizes the line elements formulation, to facilitate the simulation of thin magnetostrictive Ni layers (10 µm thick), and integrates a magnetoelastic anhysteretic model to account for the nonlinear interactions within the magnetostrictive coupling. This FEM model is capable of predicting the anhysteretic nonlinear ME behavior and the ME performance under optimal working condition.
Authors
- Yunlin Zheng (ORCID: https://orcid.org/0000-0001-8964-5603)
- M. Marangolo (ORCID: https://orcid.org/0000-0001-6211-8168)
- Hakeim Talleb (ORCID: https://orcid.org/0000-0002-2734-6242)
- Loı̈c Becerra (ORCID: https://orcid.org/0009-0008-7738-2197)
- Aurélie Gensbittel (ORCID: https://orcid.org/0000-0002-4924-2698)
- Zhuoxiang Ren (ORCID: https://orcid.org/0000-0003-4700-8969)
- T Huang (ORCID: https://orcid.org/0009-0002-9683-8264)
Institutions
- Centre National de la Recherche Scientifique (FR)
- Université Paris-Saclay (FR)
- Laboratoire de Génie Électrique et Électronique de Paris (FR)
- Sorbonne Université (FR)
- CentraleSupélec (FR)
- Institut des NanoSciences de Paris (FR)
Publication Details
- Journal
- Journal of Intelligent Material Systems and Structures
- Published
- 2024-11-28
- DOI
- https://doi.org/10.1177/1045389x241287578
- Primary Topic
- Multiferroics and related materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Agence Nationale de la Recherche