Minimization of Measurement Uncertainty in Optical Frequency Domain Reflectometry

Optical frequency domain reflectometry (OFDR) is a technique for interrogating optical fiber sensors to generate relative, quasi-distributed measurements. Although Optical frequency domain reflectometry (OFDR) is increasingly being adopted for aerospace, energy production, and structural monitoring applications, the quantification of uncertainty for OFDR measurements has not been developed beyond sparse empirical relationships. To address this knowledge gap, an uncertainty metric for OFDR measurements was developed. This uncertainty metric was applied to weight the edges between OFDR measurements on directed correlation graphs and analyzed to minimize the cumulative uncertainty. This work is the first to propose an uncertainty metric for OFDR and provides a generalized mathematical framework for optimizing OFDR hardware selection, optical fiber sensor selection, and postprocessing strategy.