A Novel Parallel Feed-Forward Current Ripple Rejection (PFFCRR) Technique for High Load Current High PSRR nMOS LDOs

There is a significant demand in systems-on-chip (SoCs) for a high-power efficiency low-dropout regulator (LDO) that provides lower dropout voltage, higher load current, and low quiescent current. A high-power supply rejection ratio (PSRR) at the mid-to-high frequency band (0.1–10 MHz) is crucial for LDO to generate low-noise power supplies when driven by switching power converters. However, this presents a significant challenge to enhancing the PSRR since the pass field-effect transistor (FET) operates in the deep triode region at high-current and dropout conditions. In this article, a parallel feed-forward current ripple rejection (PFFCRR) technique is proposed to improve the PSRR performance regardless of the operation region of the nMOS pass FET. The proposed approach senses the supply-induced current ripple and cancels the original ripple through a current path that runs parallel to the nMOS pass FET. The proposed LDO is fabricated in a 180-nm BCD process. The proposed LDO achieves a PSRR better than −35 dB up to 10 MHz at 300-mV dropout voltage with 0.5-A load current and a load capacitor of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2.2~\mu $ </tex-math></inline-formula>F. The PFFCRR approach achieves a PSRR improvement of 18 dB at 1 MHz at 100-mV dropout voltage with a 2.15-A load current when the pass FET operates in the deep triode region. Moreover, the proposed LDO enhances the transient performance with an overshoot and an undershoot of 40.54 and 36.45 mV, respectively, against <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\Delta {I}_{\text {LOAD}}$ </tex-math></inline-formula> of 1 A with a slew rate of 1 A/<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu $ </tex-math></inline-formula>s.

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Publication Details

Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Published
2024-11-27
DOI
https://doi.org/10.1109/tvlsi.2024.3497803
Citations
4
Primary Topic
Advancements in Semiconductor Devices and Circuit Design
Type
article
Field-Weighted Citation Impact
0.83
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article

A Novel Parallel Feed-Forward Current Ripple Rejection (PFFCRR) Technique for High Load Current High PSRR nMOS LDOs

S. K. Patil, Bertan Bakkaloğlu, Keith Kunz, LU Yu-hong et al.
4 citations
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Advancements in Semiconductor Devices and Circuit Design
0.83
article

A Novel Parallel Feed-Forward Current Ripple Rejection (PFFCRR) Technique for High Load Current High PSRR nMOS LDOs

S. K. Patil, Bertan Bakkaloğlu, Keith Kunz, LU Yu-hong, Bhushan Talele, Shashank Alevoor, Rakshit Dambe Nayak, Ting-Ta Yen
article en
4 citations

Abstract

There is a significant demand in systems-on-chip (SoCs) for a high-power efficiency low-dropout regulator (LDO) that provides lower dropout voltage, higher load current, and low quiescent current. A high-power supply rejection ratio (PSRR) at the mid-to-high frequency band (0.1–10 MHz) is crucial for LDO to generate low-noise power supplies when driven by switching power converters. However, this presents a significant challenge to enhancing the PSRR since the pass field-effect transistor (FET) operates in the deep triode region at high-current and dropout conditions. In this article, a parallel feed-forward current ripple rejection (PFFCRR) technique is proposed to improve the PSRR performance regardless of the operation region of the nMOS pass FET. The proposed approach senses the supply-induced current ripple and cancels the original ripple through a current path that runs parallel to the nMOS pass FET. The proposed LDO is fabricated in a 180-nm BCD process. The proposed LDO achieves a PSRR better than −35 dB up to 10 MHz at 300-mV dropout voltage with 0.5-A load current and a load capacitor of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2.2~\mu $ </tex-math></inline-formula>F. The PFFCRR approach achieves a PSRR improvement of 18 dB at 1 MHz at 100-mV dropout voltage with a 2.15-A load current when the pass FET operates in the deep triode region. Moreover, the proposed LDO enhances the transient performance with an overshoot and an undershoot of 40.54 and 36.45 mV, respectively, against <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\Delta {I}_{\text {LOAD}}$ </tex-math></inline-formula> of 1 A with a slew rate of 1 A/<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu $ </tex-math></inline-formula>s.

IEEE Transactions on Very Large Scale Integration (VLSI) SystemsVol. 33(3)
Arizona State University (US), Texas Instruments (United States) (US)
Affordable and clean energy
Openalex Percentile: Top 26%
Advancements in Semiconductor Devices and Circuit Design
0.83
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