A Survey on Machine Learning Applications in VLSI CAD
The incorporation of machine learning (ML) methodologies into VLSI computer-aided design (CAD) procedures is gaining prominence owing to its capacity to enhance design efficiency, forecast performance, and diminish time-tomarket. This literature overview examines the advanced machine learning techniques used at many phases of VLSI design. This review synthesizes data from current research articles, emphasizing the strengths, limits, and prospective avenues for machine learning implementations in VLSI CAD.
Authors
- K. Chandra Shekar (ORCID: https://orcid.org/0000-0002-4580-6142)
- Sandhya Rachamalla
Institutions
- Osmania University (IN)
Publication Details
- Journal
- International Journal of Computer Science & Engineering Survey
- Published
- 2024-10-25
- DOI
- https://doi.org/10.5121/ijcses.2024.15501
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00