A Survey on Machine Learning Applications in VLSI CAD

The incorporation of machine learning (ML) methodologies into VLSI computer-aided design (CAD) procedures is gaining prominence owing to its capacity to enhance design efficiency, forecast performance, and diminish time-tomarket. This literature overview examines the advanced machine learning techniques used at many phases of VLSI design. This review synthesizes data from current research articles, emphasizing the strengths, limits, and prospective avenues for machine learning implementations in VLSI CAD.

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Publication Details

Journal
International Journal of Computer Science & Engineering Survey
Published
2024-10-25
DOI
https://doi.org/10.5121/ijcses.2024.15501
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
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article

A Survey on Machine Learning Applications in VLSI CAD

K. Chandra Shekar, Sandhya Rachamalla
International Journal of Computer Science & Engineering Survey
Industrial Vision Systems and Defect Detection
article

A Survey on Machine Learning Applications in VLSI CAD

K. Chandra Shekar, Sandhya Rachamalla
article en

Abstract

The incorporation of machine learning (ML) methodologies into VLSI computer-aided design (CAD) procedures is gaining prominence owing to its capacity to enhance design efficiency, forecast performance, and diminish time-tomarket. This literature overview examines the advanced machine learning techniques used at many phases of VLSI design. This review synthesizes data from current research articles, emphasizing the strengths, limits, and prospective avenues for machine learning implementations in VLSI CAD.

International Journal of Computer Science & Engineering SurveyVol. 15(5)
Osmania University (IN)
Openalex Percentile: Top 69%
Industrial Vision Systems and Defect Detection
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