A 72-Channel Head Coil with an Integrated 16-Channel Field Camera for the Connectome 2.0 Scanner
Motivation: Diffusion MRI utilizing ultra-high performance gradients for high b-value in vivo brain images still suffers from low SNR and increased eddy currents artifacts. Goal(s): To construct a high-density coil array with an integrated field monitoring system. To enhance SNR and parallel image encoding, while capturing 3rd-order field dynamics. Approach: Utilizing simulations, 3D printing technology, and radiofrequency electronics to construct a 72-channel head coil and incorporate a field monitoring system. Optimization of the combined system to operate jointly in a space-constraint MRI gradient coil environment. Results: High-resolution, high b-value diffusion in vivo imaging with greatly minimized image artefacts. Impact: The constructed 72-channel head coil along with the new Connectome 2.0 scanner will enable the investigation of new microstructure features and connectivity in the living human brain.
Authors
- Lawrence L. Wald (ORCID: https://orcid.org/0000-0001-8278-6307)
- Mirsad Mahmutović (ORCID: https://orcid.org/0000-0001-9178-4194)
- Choukri Mekkaoui (ORCID: https://orcid.org/0000-0001-8597-9219)
- Boris Keil (ORCID: https://orcid.org/0000-0003-0805-8330)
- Harald E. Möller (ORCID: https://orcid.org/0000-0002-5659-1925)
- Gabriel Ramos‐Llordén (ORCID: https://orcid.org/0000-0003-4020-705X)
- John E. Kirsch (ORCID: https://orcid.org/0000-0002-0389-9475)
- Alina Scholz (ORCID: https://orcid.org/0000-0002-3324-6889)
- Manisha Shrestha (ORCID: https://orcid.org/0000-0003-2313-6835)
- Susie Y. Huang (ORCID: https://orcid.org/0000-0003-2950-7254)
Publication Details
- Journal
- Proceedings on CD-ROM - International Society for Magnetic Resonance in Medicine. Scientific Meeting and Exhibition/Proceedings of the International Society for Magnetic Resonance in Medicine, Scientific Meeting and Exhibition
- Published
- 2024-11-26
- DOI
- https://doi.org/10.58530/2024/1030
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00