Mitigating Geometric Distortion & Susceptibility Artifacts in cDTI via SAP-M2-EPI: A feasibility study
Motivation: We aimed to enhance in vivo cardiac diffusion tensor imaging (cDTI), a technique challenged by limitations, especially in high-BMI patients, causing notable aliasing and distortion issues. Goal(s): Our primary goal was to introduce and validate Short-Axis-PROPELLER-M2-EPI (SAP-M2-EPI) for cDTI. The focus was on reducing aliasing and distortion artifacts while ensuring robust motion correction. Approach: SAP-M2-EPI combines motion-compensated diffusion gradients with PROPELLER, effectively minimizing motion artifacts and suppressing aliasing and distortion. Results: Our study shows that SAP-M2-EPI successfully mitigates motion artifacts and significantly reduces aliasing and distortion, particularly beneficial for high-BMI patients. This innovative approach holds great promise for enhancing cDTI diagnostic accuracy. Impact: Impact: SAP-M2-EPI’s success offers clinicians a potent tool for enhancing cDTI diagnoses, especially in high-BMI patients. It opens doors to in-depth cardiac research, encourages further methodological innovations, and ultimately promises better patient care through more accurate imaging.
Authors
- Christopher Nguyen (ORCID: https://orcid.org/0000-0003-1475-2329)
- Danielle Kara (ORCID: https://orcid.org/0000-0001-8369-798X)
- Deborah Kwon (ORCID: https://orcid.org/0000-0003-2191-4111)
- Shi Chen (ORCID: https://orcid.org/0000-0002-5860-2616)
- Khoi Nguyen (ORCID: https://orcid.org/0009-0005-4492-5528)
- Mehdi Sadıghı (ORCID: https://orcid.org/0000-0002-4719-6229)
- Dingheng Mai (ORCID: https://orcid.org/0000-0002-5055-3231)
Publication Details
- Journal
- Proceedings on CD-ROM - International Society for Magnetic Resonance in Medicine. Scientific Meeting and Exhibition/Proceedings of the International Society for Magnetic Resonance in Medicine, Scientific Meeting and Exhibition
- Published
- 2024-11-26
- DOI
- https://doi.org/10.58530/2024/0607
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00