Accelerating Low-Field Prostate DWI: Self-Supervised Denoising for Rapid Scan Acquisition
Motivation: Diffusion-weighted imaging (DWI) is crucial for lesion detection but suffers from inherently low signal-to-noise ratio (SNR), especially in low-field settings. Goal(s): The goal of this work is to accelerate low-field prostate DWI, reducing the number of image repetitions and scan time while maintaining image quality. Approach: We present a self-supervised denoising method employing Stein's unbiased risk estimator (SURE) and a physics-based noise model and evaluate the denoising results without relying on ground-truth data. Results: Our method excels in preserving image content, outperforming other denoising techniques. This allows a substantial reduction in scan time, making it a promising advancement in low-field DWI. Impact: Our proposed denoising approach accelerates low-field prostate DWI via self-supervised denoising, improving scan efficiency without compromising image quality. We further demonstrate how to employ a physics-based noise model to evaluate denoising performance in the absence of noise-free ground-truth data.
Authors
- Thomas Benkert (ORCID: https://orcid.org/0000-0002-3794-5580)
- Fabian Wagner (ORCID: https://orcid.org/0000-0001-8178-9434)
- Tobias Wuerfl
- Mareike Thies (ORCID: https://orcid.org/0000-0002-1364-4337)
- Dominik M. Nickel (ORCID: https://orcid.org/0000-0002-0360-7233)
- Cornelius Eichner (ORCID: https://orcid.org/0000-0001-5611-6748)
- Elisabeth Weiland (ORCID: https://orcid.org/0000-0001-7517-1291)
- Laura Pfaff
- Nastassia Vysotskaya (ORCID: https://orcid.org/0000-0003-1367-7654)
- Omar Darwish (ORCID: https://orcid.org/0000-0001-8346-7148)
- Andreas Maier
Publication Details
- Journal
- Proceedings on CD-ROM - International Society for Magnetic Resonance in Medicine. Scientific Meeting and Exhibition/Proceedings of the International Society for Magnetic Resonance in Medicine, Scientific Meeting and Exhibition
- Published
- 2024-11-26
- DOI
- https://doi.org/10.58530/2024/0875
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00