Portable ultra-low-field brain MRI: test-retest reliability and correspondence to high-field MRI

Motivation: Ultra-low-field MRI scanners offer a cost-effective and portable alternative to high-field neuroimaging. Goal(s): To quantify between-scanner test-retest reliability of 64mT brain scans, and their correspondence to 3T MRI. Approach: We scanned 23 healthy participants on two Hyperfine 64mT scanners and a GE 3T scanner using T1w and T2w scans at multiple resolutions. We segmented images into 98 structures and estimated their volumes. Results: We demonstrate excellent reliability of volumetric estimates from ultra-low-field MRI, and high correspondence to high-field scans. The highest reliability and high-field correspondence was obtained using T2w ultra-low-field scans, super-resolved by combining three orthogonal acquisitions with low through-plane resolution. Impact: Measures of brain volume from Hyperfine portable ultra-low-field MRI scans show excellent test-retest reliability across scanners, and excellent correspondence to similar estimates from high-field MRI. This enables quantitative analysis of cost-effective and portable neuroimaging in various contexts, including low-resource environments.

Authors

Publication Details

Journal
Proceedings on CD-ROM - International Society for Magnetic Resonance in Medicine. Scientific Meeting and Exhibition/Proceedings of the International Society for Magnetic Resonance in Medicine, Scientific Meeting and Exhibition
Published
2024-11-26
DOI
https://doi.org/10.58530/2024/2696
Primary Topic
Advanced MRI Techniques and Applications
Type
article
Field-Weighted Citation Impact
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article

Portable ultra-low-field brain MRI: test-retest reliability and correspondence to high-field MRI

Niall Bourke, Robert Leech, Paul Cawley, Flavio Dell’Acqua et al.
Proceedings on CD-ROM - International Society for Magnetic Resonance in Medicine. Scientific Meeting and Exhibition/Proceedings of the International Society for Magnetic Resonance in Medicine, Scientific Meeting and Exhibition
Advanced MRI Techniques and Applications
article

Portable ultra-low-field brain MRI: test-retest reliability and correspondence to high-field MRI

Niall Bourke, Robert Leech, Paul Cawley, Flavio Dell’Acqua, Steven Williams, Francesco Padormo, Tomoki Arichi, František Váša, David J. Lythgoe, Rosalyn Moran, Ashwin Venkataraman, Tobias Wood, Sean Deoni, Levente Baljer, Carly Bennalick
article en

Abstract

Motivation: Ultra-low-field MRI scanners offer a cost-effective and portable alternative to high-field neuroimaging. Goal(s): To quantify between-scanner test-retest reliability of 64mT brain scans, and their correspondence to 3T MRI. Approach: We scanned 23 healthy participants on two Hyperfine 64mT scanners and a GE 3T scanner using T1w and T2w scans at multiple resolutions. We segmented images into 98 structures and estimated their volumes. Results: We demonstrate excellent reliability of volumetric estimates from ultra-low-field MRI, and high correspondence to high-field scans. The highest reliability and high-field correspondence was obtained using T2w ultra-low-field scans, super-resolved by combining three orthogonal acquisitions with low through-plane resolution. Impact: Measures of brain volume from Hyperfine portable ultra-low-field MRI scans show excellent test-retest reliability across scanners, and excellent correspondence to similar estimates from high-field MRI. This enables quantitative analysis of cost-effective and portable neuroimaging in various contexts, including low-resource environments.

Proceedings on CD-ROM - International Society for Magnetic Resonance in Medicine. Scientific Meeting and Exhibition/Proceedings of the International Society for Magnetic Resonance in Medicine, Scientific Meeting and Exhibition
Decent work and economic growth
Openalex Percentile: Top 65%
Advanced MRI Techniques and Applications
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