State-of-the-art electron beams for compact tools of ultrafast science
We review state-of-the-art electron beams for single-shot megaelectronvolt ultrafast electron diffraction (MeV-UED) and compact light sources. Our primary focus is on sub-100 femtosecond electron bunches in the 2-30 MeV energy range. We demonstrate that our new and recent simulation results permit significantly improved bunch parameters for these applications.
Authors
- Vitaliy Goryashko (ORCID: https://orcid.org/0000-0002-8217-1174)
- Peter Salén (ORCID: https://orcid.org/0000-0002-6051-5423)
- Giovanni Perosa (ORCID: https://orcid.org/0000-0003-3639-2504)
- Anatoliy Opanasenko (ORCID: https://orcid.org/0000-0002-6301-2936)
Institutions
- Uppsala University (SE)
- Kharkiv Institute of Physics and Technology (UA)
Publication Details
- Journal
- Ultramicroscopy
- Published
- 2024-11-26
- DOI
- https://doi.org/10.1016/j.ultramic.2024.114080
- Citations
- 1
- Primary Topic
- Particle Accelerators and Free-Electron Lasers
- Type
- article
- Field-Weighted Citation Impact
- 0.21
Funders
- European Commission
- Vetenskapsrådet