Improved mobility in InAs nanowire FETs with sulfur-based surface treatment
InAs exhibits high electron mobility , positioning it as a promising candidate for advanced nanoelectronic device materials. Specifically, nanowire structures are particularly advantageous for electronic device applications, offering benefits such as reduced leakage current and minimized short-channel effects due to their distinctive one-dimensional electron transport characteristics. However, the large surface-to-volume ratio of the nanowires not only significantly degrades their electrical properties but also complicates the formation of semiconductor-metal ohmic contacts . In this study, surface treatments involving sulfur and (NH 4 ) 2 S, along with rapid thermal annealing (RTA) processes, were applied to mitigate these disadvantages, resulting in a marked enhancement of the electrical properties of InAs nanowires. The electron mobility of the InAs nanowires was elevated from 83.06 cm 2 /V·s to 292.718 cm 2 /V·s through the application of passivation and RTA processes. • InAs nanowires grown on Si through self-assembly growth method. • Surface treatments dramatically enhanced the electrical properties of the InAs nanowire. • The electron mobility of the InAs nanowires considerably increased via post treatment.
Authors
- Yucheng Wu (ORCID: https://orcid.org/0000-0002-1549-0546)
- Honghyuk Kim (ORCID: https://orcid.org/0000-0002-9677-6123)
- Jae Cheol Shin (ORCID: https://orcid.org/0000-0002-5166-403X)
Institutions
- Dongguk University (KR)
- Korea Photonics Technology Institute (KR)
Publication Details
- Journal
- Current Applied Physics
- Published
- 2024-11-26
- DOI
- https://doi.org/10.1016/j.cap.2024.11.015
- Citations
- 3
- Primary Topic
- Advancements in Semiconductor Devices and Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.63