Technology for monitoring the surface emission inhomogeneity in plasma electronics devices

The article discusses a theoretical and experimental investigation of the reflection of slow electrons from the surfaces of single-crystal and polycrystalline tungsten thermionic cathodes. The findings challenge traditional ideas as they confirm that the effective reflection coefficient, reff, can reach values close to unity contrary to prior belief. The reason for this occurrence has been established, which is the additional reflection of slow electrons from a potential barrier near polycrystalline surfaces. A method has been developed to separately measure electron reflection coefficients at the surfaces of thermionic cathodes and at the potential barrier of electrode spot fields with different work functions. The study reveals that the maximum values of reff are achieved on polycrystalline surfaces. Additionally, the work functions and reflection coefficients rhkl have been determined for the faces of single crystals of (110), (112), (100), (111), and (116) oriented tungsten. The proposed method enables control over cathode emission inhomogeneity and makes it possible to mitigate the negative effects of secondary electron emission by suppressing electric fields near the cathode surface.