Screening trial of step-bunching behavior on 4H-SiC (000-1) in various solvents by interface reconstruction Authors Takeshi Mitani (ORCID: https://orcid.org/0000-0002-4228-1707) Masashi Nakamoto (ORCID: https://orcid.org/0000-0003-4684-0200) Didier Chaussende (ORCID: https://orcid.org/0000-0002-4180-8749) Sakiko Kawanishi (ORCID: https://orcid.org/0000-0002-3719-3788) Masanori Suzuki (ORCID: https://orcid.org/0000-0003-1601-2842) Takeshi Yoshikawa (ORCID: https://orcid.org/0000-0003-1991-0840) T. Noji Institutions Kyoto University (JP) Science et Ingénierie des Matériaux et Procédés (FR) National Institute of Advanced Industrial Science and Technology (JP) The University of Osaka (JP) Publication Details Journal SPIRE - Sciences Po Institutional REpository Published 2024-09-18 Primary Topic Silicon Carbide Semiconductor Technologies Type article Field-Weighted Citation Impact 0.00 Explore the Global Research Space Interactive Map