[Invited] Resistive Scanning Thermal Microscopy for localizing and monitoring defects in electronics

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SPIRE - Sciences Po Institutional REpository
Published
2024-10-17
Primary Topic
Thermal properties of materials
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article
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article

[Invited] Resistive Scanning Thermal Microscopy for localizing and monitoring defects in electronics

Séverine Gomès
SPIRE - Sciences Po Institutional REpository
Thermal properties of materials
article

[Invited] Resistive Scanning Thermal Microscopy for localizing and monitoring defects in electronics

Séverine Gomès
article en

Abstract

No abstract available for this paper.
SPIRE - Sciences Po Institutional REpository
Centre d'Énergétique et de Thermique de Lyon (FR)
Openalex Percentile: Top 87%
Thermal properties of materials
OpenAlex
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