Effect of Weibull TEF on SRGM Subject to Field Environment
The development of dependable software has been a challenging task due to the significant complexity of software that has evolved over the past few decades. Software reliability is crucial because software errors can result in significant societal or financial damages. Many of the software reliability growth models (SRGMs) discussed in the literature make the common assumption that the operating/field environment and the development (testing) environment are the same. The idea that testing and field environments are different emerged in the early 2000s. Expanding upon this premise, our study introduces a novel SRGM that takes the Weibull testing effort function (TEF) into account along with the uncertainty of the field environment. Illustrative examples are shown to highlight the efficiency of the proposed model when compared to several existing SRG models. Our suggested model’s effectiveness and applicability will be evaluated using actual collected software failure data from software applications.
Authors
- Priyanka Agarwal (ORCID: https://orcid.org/0000-0002-5276-3080)
- Anup Kumar Behera (ORCID: https://orcid.org/0009-0000-3441-6264)
Institutions
- SRM Institute of Science and Technology (IN)
Publication Details
- Journal
- International Journal of Reliability Quality and Safety Engineering
- Published
- 2024-11-23
- DOI
- https://doi.org/10.1142/s0218539324500542
- Primary Topic
- Engineering Applied Research
- Type
- article
- Field-Weighted Citation Impact
- 0.00