Optical coherence microscopy for quantitative ultrafast carriers imaging in semiconductor microstructures

Optical coherence microscopy is a promising method for visualization of the material refractive index, that is actively used for medical application. The implementation of the pump-probe scheme into optical coherence microscopy makes it possible to measure not only stationary quantities, but also to study the temporal dynamics of the optical properties changes of a sample under the optical pumping. In this work we demonstrate the possibility of the visualization of the refractive index modulation in semiconductor structures and estimation of the Q-factor of the excited resonances for lasing perovskite structure.