Research on Detection Technology and Reliability Evaluation of Relay Protection of Domestic Chip Distribution Network

The distribution network relay protection devices made of domestic chips are made through these years' efforts. However, whether it is qualified for the grid scenario is still a question. To solve this problem, this paper proposes series of detection schemes including model test, static function test, targeted test, dynamic simulation test and automation test, etc. Through these tests, five issues are identified involving anomalies in display at low temperatures, abnormal operation during vibration step tests, abnormal operation during rapid temperature change cycle tests, and abnormal operation during comprehensive stress cycle tests. Additionally, six discrepancies between domestically manufactured and imported chip devices from various manufacturers were identified, involving resistance to harmonic influence, resistance to frequency influence, real-time temperature of core boards in environmental test equipment, real-time working voltage of core boards in environmental test equipment, memory anomaly correction performance, and LCD display during low-temperature step tests.

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Publication Details

Published
2024-09-12
DOI
https://doi.org/10.1109/ciced63421.2024.10754256
Primary Topic
Telecommunications and Broadcasting Technologies
Type
article
Field-Weighted Citation Impact
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Research on Detection Technology and Reliability Evaluation of Relay Protection of Domestic Chip Distribution Network

Wenhuan Wang, Shuang Cui, Wei Li, Yifan Zhang et al.
Telecommunications and Broadcasting Technologies
article

Research on Detection Technology and Reliability Evaluation of Relay Protection of Domestic Chip Distribution Network

Wenhuan Wang, Shuang Cui, Wei Li, Yifan Zhang, Xiaoli Zhang, Wenzhong Shi
article en

Abstract

The distribution network relay protection devices made of domestic chips are made through these years' efforts. However, whether it is qualified for the grid scenario is still a question. To solve this problem, this paper proposes series of detection schemes including model test, static function test, targeted test, dynamic simulation test and automation test, etc. Through these tests, five issues are identified involving anomalies in display at low temperatures, abnormal operation during vibration step tests, abnormal operation during rapid temperature change cycle tests, and abnormal operation during comprehensive stress cycle tests. Additionally, six discrepancies between domestically manufactured and imported chip devices from various manufacturers were identified, involving resistance to harmonic influence, resistance to frequency influence, real-time temperature of core boards in environmental test equipment, real-time working voltage of core boards in environmental test equipment, memory anomaly correction performance, and LCD display during low-temperature step tests.

China Electric Power Research Institute
Openalex Percentile: Top 68%
Telecommunications and Broadcasting Technologies
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Research on Detection Technology and Reliability Evaluation of Relay Protection of Domestic Chip Distribution Network — Wenhuan Wang, Shuang Cui, et al. · (2024) | TGRS Research Map | TGRS