Structured illumination microscopy using the anti-blaze condition of a digital micromirror device

The anti-blaze condition (ABC) is a recently introduced diffraction condition for digital micromirror devices to generate structured lights for optical metrology and imaging. Here, we present the detailed procedures and methods for applying the ABC in structured illumination microscopy (SIM). We introduce effective formulae that can be used to align the illumination optics of the ABC and a practical method to build a lookup table that can be used to find proper DMD patterns for SIM with a given objective lens. The feasibility of our proposed method is demonstrated by comparing fluorescence images obtained with and without structured lights.