Te L-subshell x-ray emission induced by lower energy H2+ ions
The L-shell x-ray emission of tellurium induced by H<sub>2</sub><sup>+</sup> ions impact is investigated in an energy range of 150-300 keV. The blue shifts of various L-subshell x rays and the enhancement of the relative intensity ratios of Lι, Lβ to Lα x ray are observed and interpreted by the multiple ionization of outer-shell electrons. The new experimental x-ray production cross sections, which almost correspond to those of protons with half of the original energy, are extracted and compared with various theoretical estimations. The correction effects of the united atom approximation and the multiple ionization atomic parameters are compared, and the influence of atomic parameters from different databases on the simulations is discussed. Overall, the ECUSAR-MI calculations using theoretical atomic parameters present the best agreement with the experiment results.
Authors
- Rui Cheng (ORCID: https://orcid.org/0000-0002-8609-8488)
- Jing Wei (ORCID: https://orcid.org/0000-0001-9413-2650)
- Xianming Zhou
- Yongtao Zhao (ORCID: https://orcid.org/0000-0002-7834-1601)
- Yanning Zhang (ORCID: https://orcid.org/0000-0002-3839-2965)
- Xiaoan Zhang (ORCID: https://orcid.org/0000-0002-7003-4543)
Institutions
- Chinese Academy of Sciences (CN)
- Xianyang Normal University (CN)
- Institute of Modern Physics (CN)
- Xi'an Jiaotong University (CN)
Publication Details
- Journal
- Scientific Reports
- Published
- 2024-11-22
- DOI
- https://doi.org/10.1038/s41598-024-80191-x
- Primary Topic
- X-ray Spectroscopy and Fluorescence Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- Xianyang Normal University