Retraction: Realization of chiral multifold semimetal RhSi crystalline thin films [Phys. Rev. Materials <b>7</b>, 054201 (2023)]

We have identified a critical error in the interpretation of the crystal structure of the RhSi films grown on Si(111) substrates.This error impacts the accuracy of the discussion and conclusions drawn in the original publication.In the original paper, it was asserted that RhSi crystallized in the chiral B20-type cubic structure (space group No. 198).However, recent investigations using x-ray diffraction and high-resolution transmission electron microscopy have shown that the RhSi films actually stabilize in a different polymorph: the orthorhombic Pnma structure (space group No. 62), i.e., in a B31-type structure, instead of the previously claimed B20-type structure.The reported measurements and analyses of the magnetic and magnetotransport properties are accurate.However, their interpretation within the context of the incorrect crystal structure compromises the accuracy of the conclusions drawn.This directly affects the discussion and interpretation of the results.Therefore, a thorough reevaluation of the discussions, data interpretation, and calculations is necessary, grounded now in the correct orthorhombic crystal structure.In light of the new crystallographic evidence, we are retracting our original publication due to the misidentification of the crystal structure of RhSi films.We are committed to correcting the error and will submit a revised study with the corrected crystallographic structure and a reinterpreted analysis of the physical properties of orthorhombic RhSi films.