Spatial coherence measurement of divergent x-ray beam without prerequisite source information
Abstract Understanding the spatial coherence of synchrotron x-ray sources is crucial for both source characterization and coherent experimental techniques. Here, we present a method to probe the two-dimensional spatial complex coherence factor (CCF) of divergent x-ray beams without prerequisite source information. Phases of the divergent beams are obtained by the transport-of-intensity equation, which is indispensable for the retrieval of the CCF from the diffraction intensity of a Poisson-disk binary phase mask. Our method has been validated through simulations and is expected to be widely used in measuring coherence for fourth-generation synchrotron x-ray sources.
Authors
- Yonghua Lü (ORCID: https://orcid.org/0000-0003-1049-8474)
- Li Qingchen
- Pei Wang (ORCID: https://orcid.org/0009-0007-3968-6918)
Institutions
- University of Science and Technology of China (CN)
Publication Details
- Journal
- Journal of Optics
- Published
- 2024-11-21
- DOI
- https://doi.org/10.1088/2040-8986/ad9597
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Synchrotron Radiation Laboratory