Spatial coherence measurement of divergent x-ray beam without prerequisite source information

Abstract Understanding the spatial coherence of synchrotron x-ray sources is crucial for both source characterization and coherent experimental techniques. Here, we present a method to probe the two-dimensional spatial complex coherence factor (CCF) of divergent x-ray beams without prerequisite source information. Phases of the divergent beams are obtained by the transport-of-intensity equation, which is indispensable for the retrieval of the CCF from the diffraction intensity of a Poisson-disk binary phase mask. Our method has been validated through simulations and is expected to be widely used in measuring coherence for fourth-generation synchrotron x-ray sources.

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Publication Details

Journal
Journal of Optics
Published
2024-11-21
DOI
https://doi.org/10.1088/2040-8986/ad9597
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
0.00

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Spatial coherence measurement of divergent x-ray beam without prerequisite source information

Yonghua Lü, Li Qingchen, Pei Wang
1 links
Journal of Optics
Advanced X-ray Imaging Techniques
article

Spatial coherence measurement of divergent x-ray beam without prerequisite source information

Yonghua Lü, Li Qingchen, Pei Wang
article en

Abstract

Abstract Understanding the spatial coherence of synchrotron x-ray sources is crucial for both source characterization and coherent experimental techniques. Here, we present a method to probe the two-dimensional spatial complex coherence factor (CCF) of divergent x-ray beams without prerequisite source information. Phases of the divergent beams are obtained by the transport-of-intensity equation, which is indispensable for the retrieval of the CCF from the diffraction intensity of a Poisson-disk binary phase mask. Our method has been validated through simulations and is expected to be widely used in measuring coherence for fourth-generation synchrotron x-ray sources.

Journal of OpticsVol. 27(1)
University of Science and Technology of China (CN)
National Synchrotron Radiation Laboratory
Openalex Percentile: Top 70%
Advanced X-ray Imaging Techniques
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