Causal RL Prediction of Fine-Pitch Interconnects Using Neural Networks
In this study, we compare physics-aware neural networks for modeling fine-pitch interconnects. Results show a 5-fold reduction in test loss when imposing DC resistance through analytical equations and preserving the causality relation between resistance and inductance.
Authors
- Hakkı Ulaş Ünal (ORCID: https://orcid.org/0000-0001-8979-4625)
- Ahmet C. Durgun (ORCID: https://orcid.org/0000-0002-4802-2271)
Institutions
- Middle East Technical University (TR)
Publication Details
- Published
- 2024-10-06
- DOI
- https://doi.org/10.1109/epeps61853.2024.10754313
- Citations
- 1
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.49