A Signal Integrity Comparison of VIPPO Technology for PCIe 5.0 DC Blocking Capacitors
This work studies the signal integrity effects of VIPPO-style vias and DC blocking surface-mount capacitors required by many high-speed serdes interfaces, focusing on PCIe 5.0 transmitters. A test vehicle was built containing four via-and-capacitor configurations fixtured with coaxial probe contacts, as well as a calibration structure for broadband de-embedding. Passive measurements are discussed, and de-embedding is attempted. A set of 3D full-wave models are built that validate the reliability of de-embedded results after post-processing. The 0201-capacitor seated on VIPPO vias performs the best against the demonstrated tests from a high-speed signal integrity standpoint.
Authors
- Andrew Page
- Matteo Cocchini (ORCID: https://orcid.org/0000-0003-3579-048X)
Institutions
- Poughkeepsie Public Library District (US)
Publication Details
- Published
- 2024-10-06
- DOI
- https://doi.org/10.1109/epeps61853.2024.10754507
- Citations
- 1
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.21