PCIe Gen 6.0 SSD Receiver PAM-4 SI Analysis Based on End-Port Time-domain Measurements for Unknown System Channel
This paper presents a system-level PCI Express (PCIe) Gen 6.0 PAM-4 receiver (Rx) signal integrity (SI) analysis using time-domain measurements at a system channel-end test point (TP) without any end-to-end passive channel information such as a S-parameter model. Insertion loss (IL), return loss (RL), and near-end/far-end crosstalk (NEXT/FEXT) for the entire interconnect path at each Nyquist frequency for PCIe Gen 3.0, 4.0, and 5.0 are calculated as a result of measuring voltage waveforms at the TP when the host as the transmitter (Tx) transmits compliance bit pattern. We demonstrated for the first time that reliable Rx PAM-4 SI analysis is possible for entire end-to-end PCIe Gen 6.0 interface channel using a mimic channel model based on the calculated IL, RL, NEXT, and FEXT values.
Authors
- Young-Jun Ko
- Seokwoo Hong (ORCID: https://orcid.org/0000-0002-2232-5039)
- Chorom Jang (ORCID: https://orcid.org/0000-0002-3400-1867)
- Dong-Ho Choi (ORCID: https://orcid.org/0000-0001-5829-2892)
- Sungwoo Jin
- Kyung–Suk Kim (ORCID: https://orcid.org/0000-0003-0681-346X)
- S. D. Roh
- Taehyun Shim (ORCID: https://orcid.org/0000-0002-7745-8998)
- Jinan Lee
- Jinwook Song (ORCID: https://orcid.org/0000-0002-9921-5241)
- Hyunwoo Kim (ORCID: https://orcid.org/0000-0003-4121-1851)
- Jonghee Jeong
- Sunghoon Chun
- Juneyoung Kim (ORCID: https://orcid.org/0009-0006-1258-5108)
Institutions
- Samsung (South Korea) (KR)
Publication Details
- Published
- 2024-10-06
- DOI
- https://doi.org/10.1109/epeps61853.2024.10753949
- Primary Topic
- Advancements in PLL and VCO Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00