A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators

With a view to improve measurements, this paper presents a statistical approach for characterizing the behaviour of roughness parameters based on measurements performed on ground surface topographies (grit #080/#120). A S neoxTM (Sensofar®, Terrassa, Spain), equipped with three optical instrument modes (Focus Variation (FV), Coherence Scanning Interferometry (CSI), and Confocal Microscopy (CM)), is used according to a specific measurement plan, called Morphomeca Monitoring, including topography representativeness and several time-based measurements. Previously applied to the Sa parameter, the statistical approach based here solely on the Quality Index (QI) has now been extended to a multi-parameter approach. Firstly, the study focuses on detecting and explaining parameter disturbances in raw data by identifying and quantifying outliers of the parameter’s values, as a new first indicator. This allows us to draw parallels between these outliers and the surface topography, providing reflection tracks. Secondly, the statistical approach is applied to highlight disturbed parameters concerning the instrument mode used and the concerned grit level with two other indicators computed from QI, named homogeneity and number of modes. The applied method shows that a cleaning of the data containing the parameters values is necessary to remove outlier values, and a set of roughness parameters could be determined according to the assessment of the indicators. The final aim is to provide a set of parameters which best describe the measurement conditions based on monitoring data, statistical indexes, and surface topographies. It is shown that the parameters Sal, Sz and Sci are the most reliable roughness parameters, unlike Sdq and S5p, which appear as the most unstable parameters. More globally, the volume roughness parameters appear as the most stable, differing from the form parameters. This investigated point of view offers thus a complementary framework for improving measurement processes. In addition, this method aims to provide a global and more generalizable alternative than traditional methods of uncertainty calculation, based on a thorough analysis of multi-parameter and statistical indexes.

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Publication Details

Journal
Metrology
Published
2024-11-18
DOI
https://doi.org/10.3390/metrology4040039
Citations
2
Primary Topic
Surface Roughness and Optical Measurements
Type
article
Field-Weighted Citation Impact
0.75
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article

A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators

François Blateyron, Maxence Bigerelle, Clément Moreau, Julie Lemesle et al.
2 citations
Metrology
Surface Roughness and Optical Measurements
0.75
article

A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators

François Blateyron, Maxence Bigerelle, Clément Moreau, Julie Lemesle, David Páez Margarit
article en
2 citations

Abstract

With a view to improve measurements, this paper presents a statistical approach for characterizing the behaviour of roughness parameters based on measurements performed on ground surface topographies (grit #080/#120). A S neoxTM (Sensofar®, Terrassa, Spain), equipped with three optical instrument modes (Focus Variation (FV), Coherence Scanning Interferometry (CSI), and Confocal Microscopy (CM)), is used according to a specific measurement plan, called Morphomeca Monitoring, including topography representativeness and several time-based measurements. Previously applied to the Sa parameter, the statistical approach based here solely on the Quality Index (QI) has now been extended to a multi-parameter approach. Firstly, the study focuses on detecting and explaining parameter disturbances in raw data by identifying and quantifying outliers of the parameter’s values, as a new first indicator. This allows us to draw parallels between these outliers and the surface topography, providing reflection tracks. Secondly, the statistical approach is applied to highlight disturbed parameters concerning the instrument mode used and the concerned grit level with two other indicators computed from QI, named homogeneity and number of modes. The applied method shows that a cleaning of the data containing the parameters values is necessary to remove outlier values, and a set of roughness parameters could be determined according to the assessment of the indicators. The final aim is to provide a set of parameters which best describe the measurement conditions based on monitoring data, statistical indexes, and surface topographies. It is shown that the parameters Sal, Sz and Sci are the most reliable roughness parameters, unlike Sdq and S5p, which appear as the most unstable parameters. More globally, the volume roughness parameters appear as the most stable, differing from the form parameters. This investigated point of view offers thus a complementary framework for improving measurement processes. In addition, this method aims to provide a global and more generalizable alternative than traditional methods of uncertainty calculation, based on a thorough analysis of multi-parameter and statistical indexes.

MetrologyVol. 4(4)
Centre National de la Recherche Scientifique (FR), Senso (Spain) (ES), Laboratoire d'Automatique, de Mécanique et d'Informatique Industrielles et Humaines (FR), Université Polytechnique Hauts-de-France (FR)
Openalex Percentile: Top 31%
Surface Roughness and Optical Measurements
0.75
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