Effect of Device Parameters of SiC MOSFETs on Turn-On Overvoltage across a Freewheeling Side in a Half Bridge Configuration

This paper reveals the effects of device parameters of SiC MOSFETs on the turn-on overvoltage (V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">sur_on</inf>) that occurs in a freewheeling side device in a half bridge configuration. An equivalent circuit model consisting of an output capacitance (C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf>), a stray inductance (L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">s</inf>) and a variable voltage source is proposed to explain the mechanism of V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">sur_on</inf>. When the applied voltage by the voltage source decreases linearly with a time of t<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">r</inf>, the circuit equation derived from the equivalent circuit can be characterized by C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf>, L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">s</inf> and t<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">r</inf>, which enables an equation-based approach. The effect of the drain-source voltage (V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ds</inf>) dependency of C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf> is discussed by comparing two conditions of C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf>: One is constant C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf> and the other is variable C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf> depending on V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ds</inf>. In addition, the transient resistance of the switching side device is also included in the analysis. SPICE-based circuit simulation results are in good agreement with the equation-based waveforms, supporting the validity of this analysis.

Authors

Institutions

Publication Details

Published
2024-09-02
DOI
https://doi.org/10.1109/ecceeurope62508.2024.10751898
Citations
1
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
0.21
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Effect of Device Parameters of SiC MOSFETs on Turn-On Overvoltage across a Freewheeling Side in a Half Bridge Configuration

Ken Nakahara, Ryosuke Ishido, T. Miyazaki, Yuta Okawauchi
1 citations
Silicon Carbide Semiconductor Technologies
0.21
article

Effect of Device Parameters of SiC MOSFETs on Turn-On Overvoltage across a Freewheeling Side in a Half Bridge Configuration

Ken Nakahara, Ryosuke Ishido, T. Miyazaki, Yuta Okawauchi
article en
1 citations

Abstract

This paper reveals the effects of device parameters of SiC MOSFETs on the turn-on overvoltage (V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">sur_on</inf>) that occurs in a freewheeling side device in a half bridge configuration. An equivalent circuit model consisting of an output capacitance (C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf>), a stray inductance (L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">s</inf>) and a variable voltage source is proposed to explain the mechanism of V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">sur_on</inf>. When the applied voltage by the voltage source decreases linearly with a time of t<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">r</inf>, the circuit equation derived from the equivalent circuit can be characterized by C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf>, L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">s</inf> and t<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">r</inf>, which enables an equation-based approach. The effect of the drain-source voltage (V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ds</inf>) dependency of C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf> is discussed by comparing two conditions of C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf>: One is constant C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf> and the other is variable C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf> depending on V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ds</inf>. In addition, the transient resistance of the switching side device is also included in the analysis. SPICE-based circuit simulation results are in good agreement with the equation-based waveforms, supporting the validity of this analysis.

ROHM (JP)
Affordable and clean energy
Openalex Percentile: Top 46%
Silicon Carbide Semiconductor Technologies
0.21
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.