Effect of Device Parameters of SiC MOSFETs on Turn-On Overvoltage across a Freewheeling Side in a Half Bridge Configuration
This paper reveals the effects of device parameters of SiC MOSFETs on the turn-on overvoltage (V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">sur_on</inf>) that occurs in a freewheeling side device in a half bridge configuration. An equivalent circuit model consisting of an output capacitance (C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf>), a stray inductance (L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">s</inf>) and a variable voltage source is proposed to explain the mechanism of V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">sur_on</inf>. When the applied voltage by the voltage source decreases linearly with a time of t<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">r</inf>, the circuit equation derived from the equivalent circuit can be characterized by C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf>, L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">s</inf> and t<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">r</inf>, which enables an equation-based approach. The effect of the drain-source voltage (V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ds</inf>) dependency of C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf> is discussed by comparing two conditions of C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf>: One is constant C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf> and the other is variable C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oss</inf> depending on V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ds</inf>. In addition, the transient resistance of the switching side device is also included in the analysis. SPICE-based circuit simulation results are in good agreement with the equation-based waveforms, supporting the validity of this analysis.
Authors
- Ken Nakahara (ORCID: https://orcid.org/0000-0002-9665-5591)
- Ryosuke Ishido
- T. Miyazaki (ORCID: https://orcid.org/0000-0003-0441-0659)
- Yuta Okawauchi
Institutions
- ROHM (JP)
Publication Details
- Published
- 2024-09-02
- DOI
- https://doi.org/10.1109/ecceeurope62508.2024.10751898
- Citations
- 1
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.21