Thermal Model Validation of a Power Electronics Module for Digital Twin Application
Thermal stress is a critical failure factor for power electronics components. Hence, when developing a precise digital twin for a power system, it is imperative that thermal models provide a reliable portrayal of the component physics. In that regard, manufacturers offer simplified thermal models that enable designers and users to estimate its behaviour. Nevertheless, the accuracy of these models remains unknown, thus compromising the overall certainty of the digital twin. Therefore, it is of interest to discern whether these simplified models are sufficient for the precision required by the digital twin, and to assess the need of developing a more accurate model. Hence, this paper focuses on validating the theoretical thermal model of a power electronics switch module setup by using the deviation of the module mean time to failure (MTTF) as the acceptance parameter. To achieve this, a novel experimental validation methodology is proposed to retrieve an experimental thermal model and compare it to the theoretical one. This validation is performed considering the discrete thermal impedances and introducing the study of the coupling effects within the module.
Authors
- Claudia Cabre-Piqueras (ORCID: https://orcid.org/0000-0001-8382-1936)
- Àlber Filbà-Martínez (ORCID: https://orcid.org/0000-0002-1785-0605)
- Lukas Acker
- B. Schilder
- Svenja Zöller
Institutions
- Goethe University Frankfurt (DE)
- Institut de Recerca en Energia de Catalunya (ES)
- Frankfurt University of Applied Sciences (DE)
Publication Details
- Published
- 2024-09-02
- DOI
- https://doi.org/10.1109/ecceeurope62508.2024.10751873
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00