A BJT/Resistor Hybrid CMOS Temperature Sensor With Low 3<i>σ</i>-Inaccuracy at 0-pt Trim
Conventional temperature sensors can achieve low inaccuracy at the expense of multipoint trimming due to the nonlinear temperature dependency. However, a multipoint trimming technique cannot avoid complex and high-cost digital processing. This article proposes a bipolar junction transistor (BJT)/resistor-based hybrid complementary metal–oxide–semiconductor (CMOS) temperature sensor that achieves 0-pt trimming by reducing the high-order temperature dependency from −40 °C to 125 °C. Compliment-to-absolute-temperature (CTAT) current is generated by using a BJT while minimizing the second-order temperature dependency. A poly resistor with a feedback circuit accurately characterizes proportional-to-absolute-temperature (PTAT) current out of CTAT even if a mismatch in the resistor is present. The CTAT current is subtracted from the PTAT current to cancel the high-order characteristic of both CTAT and PTAT currents, resulting in a linearity error of less than ±0.19%. As a result, the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$3\sigma $ </tex-math></inline-formula>-inaccuracy and a figure of merit (FoM) of the proposed sensor without trimming are +0.60, −0.44 °C, and 0.84 pJ°C2.
Authors
- Jiseong Lee (ORCID: https://orcid.org/0000-0002-8747-0624)
- Yong Sin Kim (ORCID: https://orcid.org/0000-0002-6177-1496)
- Seung Soo Kwak (ORCID: https://orcid.org/0000-0002-9410-9028)
- Yun Chan Im (ORCID: https://orcid.org/0000-0001-9187-9169)
- H.G. Lee (ORCID: https://orcid.org/0009-0002-1201-0305)
Institutions
- Korea University (KR)
Publication Details
- Journal
- IEEE Transactions on Instrumentation and Measurement
- Published
- 2024-11-20
- DOI
- https://doi.org/10.1109/tim.2024.3502763
- Citations
- 1
- Primary Topic
- CCD and CMOS Imaging Sensors
- Type
- article
- Field-Weighted Citation Impact
- 0.21
Funders
- Ministry of Agriculture, Food and Rural Affairs
- National Research Foundation of Korea
- IC Design Education Center
- Korea Institute of Planning and Evaluation for Technology in Food, Agriculture and Forestry