Detection and localization methods of film resistive elements for laser adjustment of their parameters, review

Laser trimming (normalization) of film resistive elements (REs) by making adjustments to their configuration is one of the most frequently used and promising methods for tuning electrical parameters of circuits in microelectronics. Given that the geometric sizes of REs and the diameter of the laser beam are crucial initial data for resistor modeling, the necessity for analysis of the actual layout of the board is evident. The key aspect in the adjustment of film REs is precise detection and accurate determination of the RE’s position and defects within the coordinate system of the laser trimming machine using information from the video feed. The paper presents a systematic review of modern methods for detecting and localizing elements in images of microcircuit boards and hybrid integrated circuits. Literature analysis revealed that there are very few publications directly related to the task of precision detection of film resistors, except for a small number of studies. Therefore, the review also includes research on detecting and recognizing surface-mounted components, as well as defect localization on printed circuit boards.