Infrared photoinduced force near-field spectroscopy of silicon carbide

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Publication Details

Journal
Applied Surface Science
Published
2024-11-19
DOI
https://doi.org/10.1016/j.apsusc.2024.161798
Citations
3
Primary Topic
Near-Field Optical Microscopy
Type
article
Field-Weighted Citation Impact
0.55

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article

Infrared photoinduced force near-field spectroscopy of silicon carbide

Wei‐Yen Woon, Enora Vuillermet, Y. El-Helou, M. Kazan et al.
3 citations
Applied Surface Science
Near-Field Optical Microscopy
0.55
article

Infrared photoinduced force near-field spectroscopy of silicon carbide

Wei‐Yen Woon, Enora Vuillermet, Y. El-Helou, M. Kazan, Elise Usureau, Aurélien Bruyant, Kuan-Ting Wu, Gaël Gautier, Mihai Lazar
article en
3 citations

Abstract

No abstract available for this paper.
Applied Surface ScienceVol. 684
Centre National de la Recherche Scientifique (FR), Université de Technologie de Troyes (FR), National Central University (TW), Centre de Nanosciences et de Nanotechnologies (FR), Thion Medical (France) (FR), American University of Beirut (LB)
Agence Nationale de la Recherche
Openalex Percentile: Top 36%
Near-Field Optical Microscopy
0.55
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