α-Ga₂O₃ Photodetector With Responsivity Over A/W Level Based on Sn-Assisted Mist-CVD

In recent years, <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3 and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3-based photodetectors (PDs) have garnered significant attention due to their unique advantages in deep-ultraviolet (DUV) photodetection. However, the growth of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3 thin films via the mist chemical vapor deposition (mist-CVD) method faces several challenges, such as inferior crystallization quality, which impedes the development of high-performance PDs. In this study, we successfully achieved high-quality <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3 epitaxy on the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Al2O3 substrate using the tin (Sn)-assisted mist-CVD technique. A DUV PD was subsequently fabricated on the epitaxial film, and its detection performance was thoroughly evaluated. The PD achieved a photocurrent of up to 175.40 nA and a signal-to-noise ratio (SNR) of 76.5 dB. Most notably, it also exhibited a high responsivity of up to 3.76 A/W, an external quantum efficiency (EQE) of 1841.12%, and a detectivity of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.8\times 10^{{11}}$ </tex-math></inline-formula> Jones, underscoring the potential of the Sn-assisted mist-CVD method for advancing the development of next-generation <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3 DUV PDs.

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Publication Details

Journal
IEEE Sensors Journal
Published
2024-11-19
DOI
https://doi.org/10.1109/jsen.2024.3497006
Citations
4
Primary Topic
Ga2O3 and related materials
Type
article
Field-Weighted Citation Impact
0.47

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article

α-Ga₂O₃ Photodetector With Responsivity Over A/W Level Based on Sn-Assisted Mist-CVD

Weihua Tang, Yingxu Wang, Suhao Yao, Gang Li et al.
4 citations
IEEE Sensors Journal
Ga2O3 and related materials
0.47
article

α-Ga₂O₃ Photodetector With Responsivity Over A/W Level Based on Sn-Assisted Mist-CVD

Weihua Tang, Yingxu Wang, Suhao Yao, Gang Li, Maolin Zhang, Yufeng Guo, Haoxuan Peng
article en
4 citations

Abstract

In recent years, <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3 and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3-based photodetectors (PDs) have garnered significant attention due to their unique advantages in deep-ultraviolet (DUV) photodetection. However, the growth of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3 thin films via the mist chemical vapor deposition (mist-CVD) method faces several challenges, such as inferior crystallization quality, which impedes the development of high-performance PDs. In this study, we successfully achieved high-quality <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3 epitaxy on the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Al2O3 substrate using the tin (Sn)-assisted mist-CVD technique. A DUV PD was subsequently fabricated on the epitaxial film, and its detection performance was thoroughly evaluated. The PD achieved a photocurrent of up to 175.40 nA and a signal-to-noise ratio (SNR) of 76.5 dB. Most notably, it also exhibited a high responsivity of up to 3.76 A/W, an external quantum efficiency (EQE) of 1841.12%, and a detectivity of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.8\times 10^{{11}}$ </tex-math></inline-formula> Jones, underscoring the potential of the Sn-assisted mist-CVD method for advancing the development of next-generation <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3 DUV PDs.

IEEE Sensors JournalVol. 25(2)
Nanjing University of Posts and Telecommunications (CN)
National Natural Science Foundation of China, National Key Research and Development Program of China
Climate action
Openalex Percentile: Top 44%
Ga2O3 and related materials
0.47
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