α-Ga₂O₃ Photodetector With Responsivity Over A/W Level Based on Sn-Assisted Mist-CVD
In recent years, <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3 and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3-based photodetectors (PDs) have garnered significant attention due to their unique advantages in deep-ultraviolet (DUV) photodetection. However, the growth of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3 thin films via the mist chemical vapor deposition (mist-CVD) method faces several challenges, such as inferior crystallization quality, which impedes the development of high-performance PDs. In this study, we successfully achieved high-quality <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3 epitaxy on the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Al2O3 substrate using the tin (Sn)-assisted mist-CVD technique. A DUV PD was subsequently fabricated on the epitaxial film, and its detection performance was thoroughly evaluated. The PD achieved a photocurrent of up to 175.40 nA and a signal-to-noise ratio (SNR) of 76.5 dB. Most notably, it also exhibited a high responsivity of up to 3.76 A/W, an external quantum efficiency (EQE) of 1841.12%, and a detectivity of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.8\times 10^{{11}}$ </tex-math></inline-formula> Jones, underscoring the potential of the Sn-assisted mist-CVD method for advancing the development of next-generation <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\alpha $ </tex-math></inline-formula>-Ga2O3 DUV PDs.
Authors
- Weihua Tang (ORCID: https://orcid.org/0000-0002-8771-3120)
- Yingxu Wang (ORCID: https://orcid.org/0000-0003-0445-3632)
- Suhao Yao (ORCID: https://orcid.org/0009-0008-8639-3189)
- Gang Li (ORCID: https://orcid.org/0000-0001-9133-8282)
- Maolin Zhang (ORCID: https://orcid.org/0000-0002-3388-4442)
- Yufeng Guo (ORCID: https://orcid.org/0000-0002-1490-986X)
- Haoxuan Peng (ORCID: https://orcid.org/0009-0004-7156-4142)
Institutions
- Nanjing University of Posts and Telecommunications (CN)
Publication Details
- Journal
- IEEE Sensors Journal
- Published
- 2024-11-19
- DOI
- https://doi.org/10.1109/jsen.2024.3497006
- Citations
- 4
- Primary Topic
- Ga2O3 and related materials
- Type
- article
- Field-Weighted Citation Impact
- 0.47
Funders
- National Natural Science Foundation of China
- National Key Research and Development Program of China