Mechanistic Insights into Oxygen Exchange in Mixed Ionic-Electronic Conductors: A Current–Voltage Study

The oxygen incorporation reaction at solid/gas interfaces is central to many critical processes in solid-state electrochemistry, including those in electrolytic and thermochemical water splitting, fuel cells, oxygen storage for emissions control, and permeation membranes. To understand the reaction pathway and identify the rate-determining step, near-equilibrium measurements have been employed to quantify the exchange coefficients as a function of oxygen partial pressure and temperature. However, because the exchange coefficient contains contributions from both forward and reverse reaction rate constants and depends on the oxygen gas partial pressure (pO2) and oxygen fugacity (pO2,eff) in the solid, unique and definitive mechanistic assessment has been challenging. In this study, we addressed this challenge by measuring the current–voltage curve at far-from-equilibrium conditions for several mixed ionic–electronic conductors, including the (La,Sr)FeO3−δ family, (La,Sr)(Fe,Co)O3−δ, Sr(Ti,Fe)O3−δ, (La,Sr)MnO3−δ, and (Pr,Ce)O2−δ, which are commonly used as cathode materials for solid-oxide fuel cells. We isolated the driving forces acting in the gaseous and solid phases by independently controlling pO2 and pO2,eff, respectively, and a kinetics model was successfully applied. Key parameters, including the reaction orders with respect to pO2 and pO2,eff, were extracted and correlated to the reaction pathway. Further analysis showed that the vacancy formation energy is a possible descriptor for the reaction pathways.

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Publication Details

Journal
Chemistry of Materials
Published
2024-11-19
DOI
https://doi.org/10.1021/acs.chemmater.4c02732
Citations
2
Primary Topic
Electronic and Structural Properties of Oxides
Type
article
Field-Weighted Citation Impact
0.23
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article

Mechanistic Insights into Oxygen Exchange in Mixed Ionic-Electronic Conductors: A Current–Voltage Study

Dawei Zhang, C.H. Liu, Wenle Yan, William C. Chueh et al.
2 citations
Chemistry of Materials
Electronic and Structural Properties of Oxides
0.23
article

Mechanistic Insights into Oxygen Exchange in Mixed Ionic-Electronic Conductors: A Current–Voltage Study

Dawei Zhang, C.H. Liu, Wenle Yan, William C. Chueh, Hanshi Li, Di Chen, Hongyang Su, Zixuan Guan
article en
2 citations

Abstract

The oxygen incorporation reaction at solid/gas interfaces is central to many critical processes in solid-state electrochemistry, including those in electrolytic and thermochemical water splitting, fuel cells, oxygen storage for emissions control, and permeation membranes. To understand the reaction pathway and identify the rate-determining step, near-equilibrium measurements have been employed to quantify the exchange coefficients as a function of oxygen partial pressure and temperature. However, because the exchange coefficient contains contributions from both forward and reverse reaction rate constants and depends on the oxygen gas partial pressure (pO2) and oxygen fugacity (pO2,eff) in the solid, unique and definitive mechanistic assessment has been challenging. In this study, we addressed this challenge by measuring the current–voltage curve at far-from-equilibrium conditions for several mixed ionic–electronic conductors, including the (La,Sr)FeO3−δ family, (La,Sr)(Fe,Co)O3−δ, Sr(Ti,Fe)O3−δ, (La,Sr)MnO3−δ, and (Pr,Ce)O2−δ, which are commonly used as cathode materials for solid-oxide fuel cells. We isolated the driving forces acting in the gaseous and solid phases by independently controlling pO2 and pO2,eff, respectively, and a kinetics model was successfully applied. Key parameters, including the reaction orders with respect to pO2 and pO2,eff, were extracted and correlated to the reaction pathway. Further analysis showed that the vacancy formation energy is a possible descriptor for the reaction pathways.

Chemistry of MaterialsVol. 36(23)
Stanford University (US), Tsinghua University (CN)
Affordable and clean energy
Openalex Percentile: Top 50%
Electronic and Structural Properties of Oxides
0.23
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