Microstructural Underpinnings of Giant Intrinsic Exchange Bias in Epitaxial NiCo<sub>2</sub>O<sub>4</sub> Thin Films

Abstract Understanding intrinsic exchange bias in nominally single‐component ferromagnetic or ferrimagnetic materials is crucial for simplifying related device architectures. However, the mechanisms behind this phenomenon and its tunability remain elusive, which hinders the efforts to achieve unidirectional magnetization for widespread applications. Inspired by the high tunability of ferrimagnetic inverse spinel NiCo 2 O 4 , the origin of intrinsic exchange bias in NiCo 2 O 4 (111) films deposited on Al 2 O 3 (0001) substrates are investigated. The comprehensive characterizations, including electron diffraction, X‐ray reflectometry and spectroscopy, and polarized neutron reflectometry, reveal that intrinsic exchange bias in NiCo 2 O 4 (111)/Al 2 O 3 (0001) arises from a reconstructed antiferromagnetic rock‐salt Ni x Co 1 ‐x O layer at the interface between the film and the substrate due to a significant structural mismatch. Remarkably, by engineering the interfacial structure under optimal growth conditions, it can achieve exchange bias larger than coercivity, leading to unidirectional magnetization. Such giant intrinsic exchange bias can be utilized for realistic device applications. This work establishes a new material platform based on NiCo 2 O 4 , an emergent spintronics material, to study tunable interfacial magnetic and spintronic properties.

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Publication Details

Journal
Advanced Electronic Materials
Published
2024-11-15
DOI
https://doi.org/10.1002/aelm.202400149
Citations
2
Primary Topic
Magnetic properties of thin films
Type
article
Field-Weighted Citation Impact
0.68

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article

Microstructural Underpinnings of Giant Intrinsic Exchange Bias in Epitaxial NiCo2O4 Thin Films

Xiaoshan Xu, P. A. Dowben, Haile Ambaye, Detian Yang et al.
2 citations
Advanced Electronic Materials
Magnetic properties of thin films
0.68
article

Microstructural Underpinnings of Giant Intrinsic Exchange Bias in Epitaxial NiCo2O4 Thin Films

Xiaoshan Xu, P. A. Dowben, Haile Ambaye, Detian Yang, Arjun Subedi, Valeria Lauter, Chao Liu, Yaohua Liu
article en
2 citations

Abstract

Abstract Understanding intrinsic exchange bias in nominally single‐component ferromagnetic or ferrimagnetic materials is crucial for simplifying related device architectures. However, the mechanisms behind this phenomenon and its tunability remain elusive, which hinders the efforts to achieve unidirectional magnetization for widespread applications. Inspired by the high tunability of ferrimagnetic inverse spinel NiCo 2 O 4 , the origin of intrinsic exchange bias in NiCo 2 O 4 (111) films deposited on Al 2 O 3 (0001) substrates are investigated. The comprehensive characterizations, including electron diffraction, X‐ray reflectometry and spectroscopy, and polarized neutron reflectometry, reveal that intrinsic exchange bias in NiCo 2 O 4 (111)/Al 2 O 3 (0001) arises from a reconstructed antiferromagnetic rock‐salt Ni x Co 1 ‐x O layer at the interface between the film and the substrate due to a significant structural mismatch. Remarkably, by engineering the interfacial structure under optimal growth conditions, it can achieve exchange bias larger than coercivity, leading to unidirectional magnetization. Such giant intrinsic exchange bias can be utilized for realistic device applications. This work establishes a new material platform based on NiCo 2 O 4 , an emergent spintronics material, to study tunable interfacial magnetic and spintronic properties.

Advanced Electronic MaterialsVol. 11(2)
University of Nebraska–Lincoln (US), Oak Ridge National Laboratory (US), Target (United States) (US), National University of Singapore (SG)
National Science Foundation, U.S. Department of Energy, Office of Science, Division of Electrical, Communications and Cyber Systems, Office of Experimental Program to Stimulate Competitive Research, Oak Ridge National Laboratory
Openalex Percentile: Top 30%
Magnetic properties of thin films
0.68
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