On Decreasing of Mismatch-Induced Stress During Growth of Films During Magnetron Sputtering
In this paper we analyzed mass transfer during the growth of epitaxial layers during magnetron sputtering. During the analysis we obtained modifications of properties of films with variation of several parameters. We analyzed possibility to decrease mismatch -induced stress on the considered films during their growth. An analytical approach for analyzing mass transfer was introduced, which makes it possible to take into account the nonlinearity of processes, as well as changes in parameters in space and time.
Authors
- E.L. Pankratov
Institutions
- Radiophysical Research Institute (RU)
- Nizhny Novgorod State University of Engineering and Economics (RU)
Publication Details
- Journal
- International Journal of Computer-Aided Technologies
- Published
- 2024-10-28
- DOI
- https://doi.org/10.5121/ijcax.2024.11402
- Primary Topic
- Metal and Thin Film Mechanics
- Type
- article
- Field-Weighted Citation Impact
- 0.00