Various Grids in Moiré Measurements

The moiré effect is typically observed in regular periodic structures and sometimes in random (aperiodic) structures. However, currently, only regular graphical objects are used in measurements. We propose using graphical objects that are not regular but not entirely random and that resemble rows, such as grids of dotted lines or matrixes of dots. The moiré effect in such objects may become similar to the moiré effect in regular graphical objects if a relatively simple modification of the image processing algorithm is applied. We demonstrated that the results of measurements with five different graphical objects arranged in rows (including text) are similar. Using such objects can be helpful for practical moiré measurements.

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Publication Details

Journal
Metrology
Published
2024-11-15
DOI
https://doi.org/10.3390/metrology4040038
Citations
4
Primary Topic
Optical measurement and interference techniques
Type
article
Field-Weighted Citation Impact
1.00
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article

Various Grids in Moiré Measurements

Vladimir Saveljev
4 citations
Metrology
Optical measurement and interference techniques
1.00
article

Various Grids in Moiré Measurements

Vladimir Saveljev
article en
4 citations

Abstract

The moiré effect is typically observed in regular periodic structures and sometimes in random (aperiodic) structures. However, currently, only regular graphical objects are used in measurements. We propose using graphical objects that are not regular but not entirely random and that resemble rows, such as grids of dotted lines or matrixes of dots. The moiré effect in such objects may become similar to the moiré effect in regular graphical objects if a relatively simple modification of the image processing algorithm is applied. We demonstrated that the results of measurements with five different graphical objects arranged in rows (including text) are similar. Using such objects can be helpful for practical moiré measurements.

MetrologyVol. 4(4)
Konyang University (KR)
Openalex Percentile: Top 22%
Optical measurement and interference techniques
1.00
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